Spatial Domain based Image Enhancement Techniques for Scanned Electron Microscope-SEM-images
The growing need for efficiently processing
and analyzing the information contained in
digital images is a continuous challenge in
order to apply image processing. Digital
images are captured from different imaging
media elements like cameras, scanned electron
microscopes etc. While going through the
imaging process, Images get distorted in
various forms resulting in extreme dark or light
areas. All these things lead to the loss of
information. The goal in each case is to extract
useful information. In that case, Image
processing extracts useful information by
applying various image enhancement and
algorithms. In this paper, we have discussed a
practical implementation of various
enhancement methods for Scanned Electron
Microscope (SEM) images and their
experimental results. SEM images lead to very
dark and light areas in an image. While
imaging the information in the front scene is
not only the source of information but some
scenes on the dark side can also have the useful
information. Before processing any further we
require to enhance such images and one of the
enhancement techniques i.e. Histogram
Statistics comes out to be an ideal approach.
Keywords: Scanned Electron Microscope, Global Image Enhancement, Histogram Equalization, Local Image Enhancement, and Histogram Statistics
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